Manual Type Transparent Substrate Inspection Device
A substrate foreign matter inspection device that meets needs.
The "Manual Type Transparent Substrate Inspection Device" is a manual glass substrate surface inspection device/sapphire surface inspection device manufactured by YGK (Yamanashi Technical Workshop), designed for workpiece placement. It is compact and inexpensive, capable of measuring foreign substances on silicon wafers and glass substrates, and has made it possible to measure the separation of the front and back sides of glass substrates and detect latent defects on SiC surfaces, which were previously difficult. Additionally, we accept customer samples of silicon wafers/glass substrates and conduct sample measurements using the YPI series. 【Features】 ■ Unprecedented high speed, high precision, and low cost ■ Space-saving ■ Reduced measurement time, etc. *For more details, please contact us or download the catalog.
- Company：ファーストゲート 本社、大阪オフィス、笹目倉庫
- Price：Other
